The Multifrequency AFM conference series aims to create the environment where the experts and the newcomers in advanced force microscopy and nanomechanics exchange and share knowledge in the instrumentation and the theoretical aspects of the next generation of advanced force microscopes.
The conference is open to all aspects related to force microscopy operation and analysis, specifically:
- Cantilever dynamics (simulations, theory and experiments);
- Quantitative mapping of material properties;
- Force reconstruction methods;
- Nanomechanical sensing;
- Multifrequency imaging and analysis;
- Novel instrumentation;
- Molecular resolution imaging in liquid;
- Theory of dynamic force microscopy in liquid;